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JEOL Column Electron Detector Assembly JWS-2000 Wafer Defect Review SEM Working Estimated Packed Shipping Dimensions: L

SKU: 90570554253
4.9
USD455.62 USD500.62

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Shipping Estimate
USA
  • USA
  • CAN

Ships within 48 hours · Estimated delivery Aug 18 - Aug 23

Description

Estimated Packed Shipping Dimensions: L x W x H = 18"x18"x18" @ 9 lbs

Part No: H4022001

img{max-width:100%}img{max-width:100%} ASML 4022 471 4042 Circuit Board Used Working

Estimated Packed Shipping Dimensions: L x W x H = 28"x18"x18" @ 57 lbs

img{max-width:100%} ASM Advanced Semiconductor Materials 2334801-21 Processor PCB Card Rev

JEOL Column Electron Detector Assembly JWS-2000 Wafer Defect Review SEM Working Estimated Packed Shipping Dimensions: LJEOL Column Electron Detector Assembly JWS 2000 Wafer Defect Review SEM Working Part No: Electron Detector Assembly Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This JEOL Column Detector Assembly is working surplus. Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling. Sale Details Item

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