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Inventory # CONF-1530
Inventory # 14757
Mattson Technology Part No: 559-04890-00
Inventory # CONF-2491
Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope System This JEOL AP002103(00) Lens I/O PCB Card LENS I/O(2)PB is used working surplus
Varian Semiconductor Equipment AMT-1484 Matrix Tester IIS Untested Spare Inventory # CONF-1530Varian Semiconductor Equipment AMT 1484 Matrix Tester IIS Untested Spare Part No: AMT 1484 Sold As Is This Varian Semiconductor Equipment AMT 1484 Matrix Tester is used untested surplus and is being sold as is. The unit has scuffs to the body, bent connector pins, and the power switch is damaged (see photos). The physical condition is good and there are visible signs of previous use and handling. Sale Details Item Condition: Untested Surplus, Sold As
US$ 209.00
US$ 189.00
